Physical Principles Of Electron Microscopy: An Introduction To Tem, Sem, And Aem
by R.F. Egerton /
2016 / English / PDF
7 MB Download
Scanning and stationary-beam electron microscopes are
indispensable tools for both research and routine evaluation in
materials science, the semiconductor industry, nanotechnology and
the biological, forensic, and medical sciences. This book
introduces current theory and practice of electron microscopy,
primarily for undergraduates who need to understand how the
principles of physics apply in an area of technology that has
contributed greatly to our understanding of life processes and
"inner space." Physical Principles of Electron Microscopy will
appeal to technologists who use electron microscopes and to
graduate students, university teachers and researchers who need a
concise reference on the basic principles of microscopy.
Scanning and stationary-beam electron microscopes are
indispensable tools for both research and routine evaluation in
materials science, the semiconductor industry, nanotechnology and
the biological, forensic, and medical sciences. This book
introduces current theory and practice of electron microscopy,
primarily for undergraduates who need to understand how the
principles of physics apply in an area of technology that has
contributed greatly to our understanding of life processes and
"inner space." Physical Principles of Electron Microscopy will
appeal to technologists who use electron microscopes and to
graduate students, university teachers and researchers who need a
concise reference on the basic principles of microscopy.
