Statistical Modeling For Computer-aided Design Of Mos Vlsi Circuits (the Springer International Series In Engineering And Computer Science)
by Mohammed Ismail /
1993 / English / DjVu
1.6 MB Download
As MOS devices are scaled to meet increasingly demanding circuit
specifications, process variations have a greater effect on the
reliability of circuit performance. For this reason, statistical
techniques are required to design integrated circuits with maximum
yield.
As MOS devices are scaled to meet increasingly demanding circuit
specifications, process variations have a greater effect on the
reliability of circuit performance. For this reason, statistical
techniques are required to design integrated circuits with maximum
yield.Statistical Modeling for Computer-Aided Design of MOS
VLSI Circuits
Statistical Modeling for Computer-Aided Design of MOS
VLSI Circuits describes a statistical circuit simulation and
optimization environment for VLSI circuit designers. The first step
toward accomplishing statistical circuit design and optimization is
the development of an accurate CAD tool capable of performing
statistical simulation. This tool must be based on a statistical
model which comprehends the effect of device and circuit
characteristics, such as device size, bias, and circuit layout,
which are under the control of the circuit designer on the
variability of circuit performance. The distinctive feature of the
CAD tool described in this book is its ability to accurately model
and simulate the effect in both intra- and inter-die process
variability on analog/digital circuits, accounting for the effects
of the aforementioned device and circuit characteristics.
describes a statistical circuit simulation and
optimization environment for VLSI circuit designers. The first step
toward accomplishing statistical circuit design and optimization is
the development of an accurate CAD tool capable of performing
statistical simulation. This tool must be based on a statistical
model which comprehends the effect of device and circuit
characteristics, such as device size, bias, and circuit layout,
which are under the control of the circuit designer on the
variability of circuit performance. The distinctive feature of the
CAD tool described in this book is its ability to accurately model
and simulate the effect in both intra- and inter-die process
variability on analog/digital circuits, accounting for the effects
of the aforementioned device and circuit characteristics.Statistical Modeling for Computer-Aided Design of MOS VLSI
Circuits
Statistical Modeling for Computer-Aided Design of MOS VLSI
Circuits serves as an excellent reference for those working in
the field, and may be used as the text for an advanced course on
the subject.
serves as an excellent reference for those working in
the field, and may be used as the text for an advanced course on
the subject.
