Transmission Electron Microscopy And Diffractometry Of Materials
by Brent Fultz /
2009 / English / PDF
13 MB Download
This hugely successful and highly acclaimed text is designed to
meet the needs of materials scientists at all levels. In this third
edition readers get a fully updated and revised text, too. Fultz
and Howe explain concepts of transmission electron microscopy (TEM)
and x-ray diffractometry (XRD) that are important for the
characterization of materials. The edition has been updated to
cover important technical developments, including the remarkable
recent improvement in resolution of the TEM, and all chapters have
been updated and revised for clarity. A new chapter on high
resolution STEM methods has been added. Each chapter includes a set
of problems to illustrate principles, and the extensive Appendix
includes laboratory exercises.
This hugely successful and highly acclaimed text is designed to
meet the needs of materials scientists at all levels. In this third
edition readers get a fully updated and revised text, too. Fultz
and Howe explain concepts of transmission electron microscopy (TEM)
and x-ray diffractometry (XRD) that are important for the
characterization of materials. The edition has been updated to
cover important technical developments, including the remarkable
recent improvement in resolution of the TEM, and all chapters have
been updated and revised for clarity. A new chapter on high
resolution STEM methods has been added. Each chapter includes a set
of problems to illustrate principles, and the extensive Appendix
includes laboratory exercises.
