Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging Analysis
by Nobuo Tanaka /
2014 / English / PDF
34.7 MB Download
The basics, present status and future prospects of high-resolution
scanning transmission electron microscopy (STEM) are described in
the form of a textbook for advanced undergraduates and graduate
students. This volume covers recent achievements in the field of
STEM obtained with advanced technologies such as spherical
aberration correction, monochromator, high-sensitivity electron
energy loss spectroscopy and the software of image mapping. The
future prospects chapter also deals with z-slice imaging and
confocal STEM for 3D analysis of nanostructured materials.
The basics, present status and future prospects of high-resolution
scanning transmission electron microscopy (STEM) are described in
the form of a textbook for advanced undergraduates and graduate
students. This volume covers recent achievements in the field of
STEM obtained with advanced technologies such as spherical
aberration correction, monochromator, high-sensitivity electron
energy loss spectroscopy and the software of image mapping. The
future prospects chapter also deals with z-slice imaging and
confocal STEM for 3D analysis of nanostructured materials.
Readership: Graduate students and researchers in the field of
nanomaterials and nanostructures.
Readership: Graduate students and researchers in the field of
nanomaterials and nanostructures.
